Design-Reuse

Genesys Testware Adds Top-Down Insertion of Test and Repair Circuits for Embedded Memory

FREMONT, Calif.--July 12, 2006--Genesys Testware, Inc., a leading supplier of yield, quality and cost optimization tools for nanometer ICs, announced today the addition of top-down insertion of test ...
Design-Reuse

Genesys Testware introduces hierarchical test solution for logic and wiring in system IC

Anaheim, California, June 2, 2003. Genesys Testware, Inc., a leading supplier of embedded test solutions, today announced the introduction of HiertestMakerTM - a hierarchical test solution for logic ...
InfoQ

Open Source Testware for Systematic IoT Testing: Eclipse IoT-Testware

Unlock the full InfoQ experience by logging in! Stay updated with your favorite authors and topics, engage with content, and download exclusive resources. Vivek Yadav, an engineering manager from ...
EDN

Genesys Testware adds capabilities to ArraytestMaker

SAN FRANCISCO — Genesys Testware Inc. has added efficient automated insertion of embedded test and repair circuits for memory into system IC designs to it's ArraytestMaker product, the company said ...